Reformulation of atom location by channeling enhanced microanalysis

Goo, E.
June 1986
Applied Physics Letters;6/30/1986, Vol. 48 Issue 26, p1779
Academic Journal
The current formulation for atom location by channeling enhanced microanalysis requires three characteristic x-ray spectra and is overdefined [J. C. H. Spence and J. Tafto, J. Microscopy 130, 147 (1983)]. A formulation is presented where only two characteristic x-ray spectra are needed to determine the distribution of substitutional impurity atoms in a layered compound.


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