Role of tip structure in scanning tunneling microscopy

Kuk, Y.; Silverman, P. J.
June 1986
Applied Physics Letters;6/9/1986, Vol. 48 Issue 23, p1597
Academic Journal
An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip.


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