Double-crystal x-ray topographic studies of bulk and epitaxially grown ZnxCd1-xTe (0.0≤x≤0.06)

Qadri, Syed B.; Fatemi, M.; Dinan, J. H.
January 1986
Applied Physics Letters;1/20/1986, Vol. 48 Issue 3, p239
Academic Journal
The first double-crystal topographic studies of epitaxial layers of ZnxCd1-xTe (0≤x≤0.06) grown by molecular beam epitaxy are reported in this letter. A comparison of bulk and epitaxially grown ZnCdTe clearly indicates that the epitaxial layers are of better structural quality and are more suitable for use as substrates for growth of HgCdTe.


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