Differential surface photovoltage measurement of minority-carrier diffusion length in thin films

Schwarz, R.; Slobodin, D.; Wagner, S.
October 1985
Applied Physics Letters;10/1/1985, Vol. 47 Issue 7, p740
Academic Journal
A new surface photovoltage technique is introduced for the determination of the minority-carrier diffusion length in thin semiconductor films. The technique eliminates the effect of a back surface barrier on the measurement by separating out the back barrier contribution to the total photovoltage signal. With a direct difference method based on a double lock-in technique, the measurement can be carried out in a single run.


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