TITLE

Quantitative measurements of the stoichiometry of anodic oxides grown on Hg0.78Cd0.22Te

AUTHOR(S)
Stahle, C. M.; Thomson, D. J.; Helms, C. R.; Becker, C. H.; Simmons, A.
PUB. DATE
September 1985
SOURCE
Applied Physics Letters;9/1/1985, Vol. 47 Issue 5, p521
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
The Hg concentration in anodic oxides grown on Hg0.78Cd0.22Te has been measured by Rutherford backscattering and surface analysis by laser ionization techniques. A significant Hg content is found, and this result is contrasted with previous compositional studies which have concluded that a very low Hg concentration exists in the anodic oxide grown on Hg1-xCdxTe. In addition, a model reaction is proposed which suggests that Hg and Te are dissolved in the anodizing solution to a much greater extent than Cd during the oxidation process.
ACCESSION #
9818078

 

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