Quantitative measurements of the stoichiometry of anodic oxides grown on Hg0.78Cd0.22Te

Stahle, C. M.; Thomson, D. J.; Helms, C. R.; Becker, C. H.; Simmons, A.
September 1985
Applied Physics Letters;9/1/1985, Vol. 47 Issue 5, p521
Academic Journal
The Hg concentration in anodic oxides grown on Hg0.78Cd0.22Te has been measured by Rutherford backscattering and surface analysis by laser ionization techniques. A significant Hg content is found, and this result is contrasted with previous compositional studies which have concluded that a very low Hg concentration exists in the anodic oxide grown on Hg1-xCdxTe. In addition, a model reaction is proposed which suggests that Hg and Te are dissolved in the anodizing solution to a much greater extent than Cd during the oxidation process.


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