Time-resolved exciton recombination in CdTe/Cd1-xMnxTe multiple quantum wells

Zhang, X.-C.; Chang, S.-K.; Nurmikko, A. V.; Kolodziejski, L. A.; Gunshor, R. L.; Datta, S.
July 1985
Applied Physics Letters;7/1/1985, Vol. 47 Issue 1, p59
Academic Journal
The lifetime of excitons in CdTe/Cd1-xMnxTe multiple quantum wells at low temperature has been measured by time-resolved photoluminescence in samples of different well thickness. The excitons, which have elsewhere been shown to be localized preferentially near the heterointerfaces, possess an average lifetime which becomes shorter with decreasing well thickness and increasing external magnetic field. The results are in qualitative agreement with the expectations for a localized quasi-two-dimensional exciton with a large radiative recombination cross section.


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