TITLE

Reversibility and stability of tellurium alloys for optical data storage applications

AUTHOR(S)
Chen, M.; Rubin, K. A.; Marrello, V.; Gerber, U. G.; Jipson, V. B.
PUB. DATE
April 1985
SOURCE
Applied Physics Letters;4/15/1985, Vol. 46 Issue 8, p734
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We demonstrate for the first time that Te87Ge8Sn5 films, which are amorphous as deposited, can be optically switched between the crystalline and amorphous states more than 106 times. The measured reflectivity changed from 40% to 60% and the transmission changed from 3% to 1.5%, respectively, between the amorphous and crystalline states. The crystallization temperature of the cycled spots is ≊75 °C and these spots are observable after >20 weeks. It is found that the crystallization temperature of cycled spots is typically about 20 °C lower than that of the unwritten film. Increasing the Ge concentration leads to increased crystallization temperature and increased minimum crystallization time without affecting reversibility.
ACCESSION #
9817425

 

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