TITLE

Muonium as a probe for defects in electron irradiated silicon

AUTHOR(S)
Albert, E.; Barth, S.; Möslang, A.; Recknagel, E.; Weidinger, A.; Moser, P.
PUB. DATE
April 1985
SOURCE
Applied Physics Letters;4/15/1985, Vol. 46 Issue 8, p759
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Electron irradiated silicon was investigated by the muon spin rotation (μSR) technique. We found a strong correlation between the muon spin relaxation rate and the annealing behavior of irradiation induced defects (E and A centers).
ACCESSION #
9817413

 

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