New method of measuring relaxation times in semiconductors

Mukherjee, P.; Sheik-Bahaei, M.; Kwok, H. S.
April 1985
Applied Physics Letters;4/15/1985, Vol. 46 Issue 8, p770
Academic Journal
A new method of measuring relaxation times of free carriers in semiconductors is proposed and demonstrated. It is based on the pulse duration dependence of free-carrier absorption through the sample. This method has been demonstrated with GaAs and InSb.


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