A multipurpose scanning probe microscope

Sander, M.
September 1993
Review of Scientific Instruments;Sep93, Vol. 64 Issue 9, p2591
Academic Journal
A versatile scanning probe microscope is described that offers the combination of use for imaging in ambient atmosphere, under a liquid, and in ultrahigh vacuum. In contrast to any home-built or commercial instruments available at present, these features are realized here in a single instrument. A compact size instrument is achieved by a piezoelectrically driven sample approach mechanism. The sample or the tip can be scanned providing two separate scanning modes which cover a total scan range from 20 Å to 10 μm. An area of 30 mm² can be scanned without breaking the tip/sample contact. Exchangeable tip mounts facilitate an easy change between prealigned tips. The design of the scanning force microscope is based on the optical deflection method for imaging in the contact mode. The microscope can be used as a scanning tunneling microscope as well.


Related Articles

  • Simple low-drift heating stage for scanning probe microscopes. Oulevey, F.; Gremaud, G.; Kulik, A.J.; Guisolan, B. // Review of Scientific Instruments;Mar99, Vol. 70 Issue 3, p1889 

    Discusses the development of a simple low-cost heating stage for scanning probe microscopes. Goal of minimizing the drift due to thermal expansion of the sample and of the heater itself; Adaptation of the stage to most commercial microscopes; Non-requirement of modifications to the microscope...

  • Probe cantilever knows its place.  // Laser Focus World;Feb2003, Vol. 39 Issue 2, p41 

    Reports on the development of desktop scanning-probe microscope. Advantage of desktop microscope over the conventional probe microscopes; Features of scanning probe microscope; Use of voice-coil motor.

  • Large scanning area near field optical microscopy Wei, P.K.; Fann, W.S. // Review of Scientific Instruments;Oct98, Vol. 69 Issue 10, p3614 

    Demonstrates the use of a near field optical microscope with a scanning area. Elements of the scanning device; Application of the microscope to map out the evanescent wave; Basis for the detection of vibrational angle.

  • A stroboscopic scanning solid immersion lens microscope. Stotz, J.A.H.; Freeman, M.R. // Review of Scientific Instruments;Dec1997, Vol. 68 Issue 12, p4468 

    Presents a high resolution scanning optical microscope for stroboscopic time-resolved studies. Motivation in selecting a solid immersion lens to surpass conventional diffraction limited resolution; Design of the microscope; Use of a thin-film magnetic recording head; Enhancement of the spatial...

  • A novel cryogenic scanning laser microscope tested on Josephson tunnel junctions. Holm, J.; Mygind, J. // Review of Scientific Instruments;Sep95, Vol. 66 Issue 9, p4547 

    Describes the design of a novel cryogenic scanning laser microscope for on-chip in situ investigations of the working properties of normal and superconducting circuits and devices. Detection of the electrical response of the circuit to a very localized heating induced by irradiation from a...

  • A novel bimorph-type actuator for use in scanning probe microscopes. Hammiche, A.; Webb, R. P.; Wilson, I. H. // Review of Scientific Instruments;Nov93, Vol. 64 Issue 11, p3332 

    We describe a novel bimorph-type piezoelectric transducer which achieves three-dimensional positioning in a 70 µm ×70 µm × 10 µm volume with applied voltage ranges less than 100 V. This transducer, appropriately shaped and with appropriately patterned electrodes, has been tested...

  • The 2010-2015 World Outlook for Scanning Probe Microscopes. Parker, Philip M. // World Outlook Reports;1/ 1/2010, pN.PAG 

    Several charts are presented which offer information on the 2010 to 2015 world outlook for scanning probe microscopes in Asia, Europe and Middle East.

  • Microscope Handles Biological and Materials Applications.  // R&D Magazine;May2000, Vol. 42 Issue 5, p84 

    Describes a near-field scanning optical microscope from Digital Instruments. Design features; Applications.

  • Drift elimination in the calibration of scanning probe microscopes. Staub, R.; Alliata, D.; Nicolini, C. // Review of Scientific Instruments;Mar95, Vol. 66 Issue 3, p2513 

    Proposes a method of calibrating the scanning probe microscope (SPM) eliminating the effects of drift in a first-order approximation. Use of the method in calculating the piezo sensitivity from SPM images; Success in calibrating a commercial SPM system for atomic resolution scans with a...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics