TITLE

An atomic-resolution cryogenic scanning tunneling microscope

AUTHOR(S)
Chen, X.; Frank, E. R.; Hamers, R. J.
PUB. DATE
November 1994
SOURCE
Review of Scientific Instruments;Nov94, Vol. 65 Issue 11, p3373
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
A design is presented for a cryogenic scanning tunneling microscope which has demonstrated atomic resolution at temperatures between 300 and 120 K in ultrahigh vacuum. The design features simple in situ exchange of samples and tips, active cooling of the sample, excellent visibility of the sample-tip region, and the use of a thermally isolated inchworm translator for coarse approach. It has demonstrated atomic resolution on SI(111)-(7×7) and Si(001) surfaces at 120 K.
ACCESSION #
9786312

 

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