TITLE

In situ tip exchange for an ultrahigh vacuum scanning tunneling microscope using dual-axes piezoelectric micropositioners

AUTHOR(S)
Osaka, F.; Kato, T.
PUB. DATE
December 1992
SOURCE
Review of Scientific Instruments;Dec1992, Vol. 63 Issue 12, p5644
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have constructed an in situ tip-exchangeable ultrahigh vacuum scanning tunneling microscope (UHV–STM). The STM has dual-axes piezoelectric micropositioners, and a damaged tip can be exchanged in situ for a new tip by moving the two micropositioners alternately. We have demonstrated that our tip-exchange method has great advantages of reliability, accuracy, simplicity, and ease of operation. These advantages have been shown to result from extremely high mechanical resolutions of these micropositioners. From the measured STM image of a GaInAs/InP multiquantum well (110) cleaved surface it has been demonstrated that the constructed tip-exchangeable STM works stably with an atomic resolution under UHV.
ACCESSION #
9782190

 

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