Ion source metal-arc fault current protection circuit

deVries, G. J.; Lietzke, A. F.; van Os, C. F. A.; Stearns, J. W.
December 1991
Review of Scientific Instruments;Dec1991, Vol. 62 Issue 12, p3098
Academic Journal
Ion sources can be damaged by arcs between metallic components of the source if these arcs are permitted to last. The negative-biased low-work-function converter in a surface conversion negative ion source is especially susceptible to metal-arc breakdown damage. Here an electronic circuit for minimizing the damage caused by such an arc is described. The circuit uses a transistor switch and an inductor in series with the converter bias power supply to limit the damage during the metal-arc breakdown.


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