TITLE

Measurements of NBI and ion cyclotron range of frequency power deposition profiles using charge exchange spectroscopy

AUTHOR(S)
Ozaki, T.; Kadota, K.; Ogawa, Y.; Fujita, J.
PUB. DATE
August 1988
SOURCE
Review of Scientific Instruments;Aug1988, Vol. 59 Issue 8, p1503
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Power deposition profiles of a heating neutral beam and/or an ion cyclotron range of frequency (ICRF) heating have been measured on the JIPP T-IIU tokamak. The deposition is obtained from the rise time of the ion temperature, which is measured from the Doppler broadening of C VI emission produced by charge exchange reaction between a neutral beam and a carbon impurity. The power deposition of ICRF has been found to be flatter than that of neutral beam injection (NBI). The thermal diffusivities are 4-5 times larger than the neoclassical values both in NBI and NBI + ICRF cases.
ACCESSION #
9781580

 

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics