Scanned-cantilever atomic force microscope

Baselt, David R.; Baldeschwieler, John D.
April 1993
Review of Scientific Instruments;Apr93, Vol. 64 Issue 4, p908
Academic Journal
We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilever. The performance of the microscope matches that of scanned-sample instruments.


Related Articles

  • Low-cost modification of a contact atomic force microscope (AFM) into a sound-activated tapping... Vinckier, Anja; Hennau, Frans; Kjoller, Kevin; Hellemans, Louis // Review of Scientific Instruments;Feb1996, Vol. 67 Issue 2, p387 

    Presents a low-cost implementation of tapping mode atomic force microscope (AFM) on a commercial instrument. Tapping mode AFM in air; Tapping mode AFM in liquid.

  • Temperature controlled microstage for an atomic force microscope. Musevic, I.; Slak, G.; Blinc, R. // Review of Scientific Instruments;Jul96, Vol. 67 Issue 7, p2554 

    Presents a temperature controlled microstage for an atomic force microscope (AFM). Performances of AFM in air at elevated temperatures; Achieving atomic resolution.

  • Parallel beam approximation for V-shaped atomic force microscope cantilevers. Sader, John Elie // Review of Scientific Instruments;Sep95, Vol. 66 Issue 9, p4583 

    Presents a detailed investigation of the deflection properties of the V-shaped atomic force microscope cantilever. Validity and accuracy of the parallel beam approximation provided the width and length of the parallel rectangular arms are chosen appropriately; Geometry of the V-shaped cantilever.

  • A hydrothermal atomic force microscope for imaging in aqueous solution up to 150 degrees C. Higgins, Steven R.; Eggleston, Carrick M.; Knauss, Kevin G.; Boro, Carl O. // Review of Scientific Instruments;Aug1998, Vol. 69 Issue 8, p2994 

    Presents a design of a contact atomic force microscope (AFM) for aqueous solution imaging. Features of the AFM; Advantages of the design; Details on the unit-cell scale vertical resolution of the AFM.

  • Susceptibility of atomic force microscope cantilevers to lateral forces. Sader, John Elie // Review of Scientific Instruments;Apr2003, Vol. 74 Issue 4, p2438 

    V-shaped cantilevers are used widely in the atomic force microscope (AFM) due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established...

  • AFM Emerges as Essential R&D Tool. Lindsay, Stuart // R&D Magazine;Sep99, Vol. 41 Issue 10, p49 

    Presents information on the atomic force microscope (AFM). Description and composition; Benefits and cost-effectiveness; Limitations and primary use; Use in the study of enzymes.

  • A high stability and low drift atomic force microscope. Hug, H. J.; Jung, Th.; Güntherodt, H.-J. // Review of Scientific Instruments;Aug1992, Vol. 63 Issue 8, p3900 

    Impressed by the high resolution and easy operation of the new generation scanning tunneling microscopes (STMs), we built a pocket-size high-stability atomic force microscope (AFM) with deflection measurement by tunneling. It was our aim to reach high mechanical and thermal stability of the...

  • Erratum: ‘‘Calibration of atomic-force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)]. Hutter, Jeffrey L.; Bechhoefer, John // Review of Scientific Instruments;Nov93, Vol. 64 Issue 11, p3342 

    In our calibration of atomic-force microscope cantilevers, we neglected to correct for the frequency response of the optical-detection electronics. The response to cantilever vibrations will have a high-frequency cut-off, which, in our case, was higher than the resonant frequency of the...

  • A low-temperature ultrahigh vacuum atomic force microscope for biological applications. Radenovic, Alexandra; Bystrenová, Eva; Libioulle, Laurent; Taborelli, Mauro; DeRose, James A.; Dietler, Giovanni // Review of Scientific Instruments;Feb2003, Vol. 74 Issue 2, p1022 

    We present an atomic force microscope (AFM) for operation at low temperatures under ultrahigh vacuum conditions. It uses the laser beam deflection method to measure the bending of the cantilever. The four quadrant photodiode allows the detection of vertical and lateral forces. The AFM has been...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics