TITLE

Scanned-cantilever atomic force microscope

AUTHOR(S)
Baselt, David R.; Baldeschwieler, John D.
PUB. DATE
April 1993
SOURCE
Review of Scientific Instruments;Apr93, Vol. 64 Issue 4, p908
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We have developed a 3.6 μm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilever. The performance of the microscope matches that of scanned-sample instruments.
ACCESSION #
9780920

 

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