TITLE

Domain structure study of SrBi[sub 2]Ta[sub 2]O[sub 9] ferroelectric thin films by scanning capacitance microscopy

AUTHOR(S)
Leu, Ching-Chich; Chen, Chih-Yuan; Chien, Chao-Hsin; Chang, Mao-Nan; Hsu, Fan-Yi; Hu, Chen-Ti
PUB. DATE
May 2003
SOURCE
Applied Physics Letters;5/19/2003, Vol. 82 Issue 20, p3493
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Scanning capacitance microscopy was used to image the polarization-induced microstructural patterns of sol-gel derivative SrBi[sub 2]Ta[sub 2]O[sub 9] (SBT) thin films. A sharp image contrast was induced between the nanosized domains owing to the various polarities, so that the domain structure in the SBT thin film was clearly revealed. As a result, the switched and unswitched regions could be unequivocally identified. This investigation also confirms that the reversal polarization process of a ferroelectric domain is much easier inside a large grain than in a small grain.
ACCESSION #
9741832

 

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