In situ transmission electron microscopy study of plastic deformation in passivated Al-Cu thin

Jawaranin, D.; Kawasaki, H.
July 1997
Journal of Applied Physics;7/1/1997, Vol. 82 Issue 1, p171
Academic Journal
Studies plastic deformation in passivated Al-1 wt %Cu thin films using a straining device in the transmission electron microscope. Microstructural studies of passivated and unpassivated thin films; Plastic deformation experiments involving in situ transmission electron microscope (TEM) straining.


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