Applications of atomic force microscopy

Demanet, C.M.
July 1997
South African Journal of Science;Jul97, Vol. 93 Issue 7, p298
Academic Journal
Features atomic force microscopy's application to analyze the surface properties of materials ranging from semiconductors to biomaterials. Capability of imaging equally well nonconducting and conducting samples; Lateral force microscopy; Force modulation; Magnetic force microscopy.


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