TITLE

Applications of atomic force microscopy

AUTHOR(S)
Demanet, C.M.
PUB. DATE
July 1997
SOURCE
South African Journal of Science;Jul97, Vol. 93 Issue 7, p298
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Features atomic force microscopy's application to analyze the surface properties of materials ranging from semiconductors to biomaterials. Capability of imaging equally well nonconducting and conducting samples; Lateral force microscopy; Force modulation; Magnetic force microscopy.
ACCESSION #
9711065914

 

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