TITLE

Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison

AUTHOR(S)
Belaidi, S.; Girard, P.
PUB. DATE
February 1997
SOURCE
Journal of Applied Physics;2/1/1997, Vol. 81 Issue 3, p1023
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Presents calculations on the exact electrostatic force acting on the real tip of an atomic force microscope. Modeling of electrostatic forces applied to a single tip; Potential distribution between a conical rounded tip and the plane; Static forces; Comparison with analytic models.
ACCESSION #
9709224162

 

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