TITLE

The test floor

AUTHOR(S)
Erkanat, Judy
PUB. DATE
April 1997
SOURCE
Electronic News;04/07/97, Vol. 43 Issue 2162, p48
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Reports on developments related to integrated circuit testing as of April 7, 1997. Includes Integrated Measurement Systems' (IMS) TestDirect virtual test productivity tool; Silicon Graphics' order for the new Teradyne J973 VLS test system; Texas Instruments' purchase of a J973 VLSI tester.
ACCESSION #
9704263670

 

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