TITLE

Growth and characterization of sputtered epitaxial γ[sup ′]Fe[sub 4]N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry

AUTHOR(S)
Loloee, R.; Nikolaev, K. R.; Pratt, W. P.
PUB. DATE
May 2003
SOURCE
Applied Physics Letters;5/12/2003, Vol. 82 Issue 19, p3281
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Epitaxial single-crystal ferromagnetic Fe[SUB4]N films (γ' phase of iron nitride), nonmagnetic NbN films, and NbN/Fe[SUB4]N bilayers were grown on MgO(100) substrates by sputter deposition in N[SUB2] gas. Electron backscatter diffraction patterns were used to characterize the structural properties including the relative crystallographic orientation of the sputter deposited Fe[SUB4]N and NbN films with respect ton the substrate and each other. Superconducting quantum interference device magnetometry was used to study the in-plane uniaxial anisotropy and determine the directions of the easy axes in ferromagnetic Fe[SUB4]N films.
ACCESSION #
9697710

 

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