TITLE

Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy

AUTHOR(S)
Schroer, C. G.; Kuhlmann, M.; Günzler, T. F.; Lengeler, B.; Richwin, M.; Griesebock, B.; Lützenkirchen-Hecht, D.; Frahm, R.; Ziegler, E.; Mashayekhi, A.; Haeffner, D. R.; Grunwaldt, J.-D.; Baiker, A.
PUB. DATE
May 2003
SOURCE
Applied Physics Letters;5/12/2003, Vol. 82 Issue 19, p3360
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Hard x-ray absorption spectroscopy is combined with scanning microtomography to reconstruct full near-edge spectra of an elemental species at each location on an arbitrary virtual section through a sample. These spectra reveal the local concentrations of different chemical compounds of the absorbing element inside the sample and give insight into the oxidation state, the local atomic structure, and the local projected free density of states. The method is implemented by combining a quick scanning monochromator and data acquisition system with a scanning microprobe setup based on refractive x-ray lenses.
ACCESSION #
9697683

 

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