CuAu-I-type ordered structures in In[sub x]Al[sub 1-x]As epilayers grown on (001) InP substrates

Lee, Ho Seong; Lee, Jeong Yong
May 2003
Applied Physics Letters;5/5/2003, Vol. 82 Issue 18, p2999
Academic Journal
Transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in In[sub x]A1[sub 1 - x]As epitaxial layers grown on (001) InP substrates. The selected area diffraction pattern showed two sets of superstructure reflections with symmetrical intensity at (100) and (010) positions, indicating that CuAu-I-type ordered structures with two different variants were formed in the In[sub x]Al[sub 1 - x]As epitaxial layers. The dark-field TEM image showed that the size of the CuAu-I-type ordered domains with a needle-like shape was approximately 3∼4 nm thick, with lengths ranging from 10 to 20 nm. Based on the TEM results, explanations are given to describe the formation of only two variants of CuAu-I-type ordering.


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