Laser-diode-stimulated emission depletion microscopy

Westphal, V.; Blanca, C. M.; Dyba, M.; Kastrup, L.; Hell, S. W.
May 2003
Applied Physics Letters;5/5/2003, Vol. 82 Issue 18, p3125
Academic Journal
We report subdiffraction resolution in far-field fluorescence microscopy through laser-diode-stimulated emission depletion of molecular markers. The diode-generated focal intensities lead to a resolution improvement by ∼45% in both lateral directions. Excitation and stimulated emission are performed with electronically synchronized diode pulses of 50-70 ps and 300-400 ps duration, respectively. The subdiffraction resolution is utilized to resolve neighboring individual molecules.


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