TITLE

The test floor

AUTHOR(S)
Erkanat, Judy; Bradley, Gale
PUB. DATE
November 1996
SOURCE
Electronic News;11/11/96, Vol. 42 Issue 2142, p28
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Reports on developments related to integrated circuit (IC) testing in the United States as of November 11, 1996. Includes GenRad's winning of manufacturing test system orders exceeding $1 million; Electroglas' new global training facility near Santa Clara, California; Enhancements to Integrated Measurement Systems' (IMS) Dantes test design and verification environment.
ACCESSION #
9611262689

 

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