Interfacial reaction during the epitaxial growth of yttrium on CaF[sub 2](111)

Borgschulte, A.; Weber, S.; Schoenes, J.
April 2003
Applied Physics Letters;4/28/2003, Vol. 82 Issue 17, p2898
Academic Journal
By means of Auger electron spectroscopy and in situ reflection high-energy electron diffraction (RHEED) the interfacial reaction during the epitaxial growth of yttrium on CaF[SUB2](111) has been studied. The RHEED patterns confirm a smooth Volmer-Weber growth mode. Auger electron spectroscopy evidences a strong interdiffusion of the film and substrate, leading to a compressive in-plane strain of the growing film. Using RHEED, we can follow the strain relaxation via misfit glides during growth. The development and crystalline orientation of the glides are characterized.


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