Calibration of a scanning Joule expansion microscope (SJEM)

Cannaerts, M.; Buntinx, D.; Volodin, A.; Van Haesendonck, C.
March 2001
Applied Physics A: Materials Science & Processing;Mar2001 Supplement, Vol. 72, pS67
Academic Journal
Scanning thermal microscopy (SThM) is a scanning probe technique based on atomic force microscopy (AFM) enabling high-resolution topographical imaging together with visualization of the temperature distribution in the studied sample. For the thermal mapping, rather expensive, micro-fabricated cantilevers with integrated thermocouples have to be used. The spatial resolution is typically limited to 100 nm. Scanning Joule expansion microscopy (SJEM) uses an alternative approach to detect the temperature of the sample with a regular silicon cantilever and lock-in detection. By monitoring the thermal expansion of the sample (due to Joule heating), the local temperature can be monitored. The resolution of SJEM is comparable to that of contact AFM, which is an order of magnitude better than for SThM. Our research involves implementing a SJEM for the study of heating phenomena in mesoscopic structures prepared by electron beam lithography and lift-off techniques. In particular, we calibrated our SJEM in order to make quantitative temperature maps of the studied samples.


Related Articles

  • Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. Gates, Richard S.; Reitsma, Mark G. // Review of Scientific Instruments;Aug2007, Vol. 78 Issue 8, p086101 

    A method for calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using an array of uniform microfabricated reference cantilevers. A series of force-displacement curves was obtained using a commercial AFM test cantilever on the reference cantilever array, and...

  • Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers. Koo-Hyun Chung; Reitsma, Mark G. // Review of Scientific Instruments;Feb2010, Vol. 81 Issue 2, p026104 

    This note outlines a calibration method for atomic force microscope friction measurement that uses the “pivot” method of [Bogdanovic et al., Colloids Surf. B 19, 397 (2000)] to generate optical lever sensitivities for known torque applied to rectangular cantilevers. We demonstrate...

  • Noninvasive determination of optical lever sensitivity in atomic force microscopy. Higgins, M. J.; Proksch, R.; Sader, J. E.; Polcik, M.; Mc Endoo, S.; Cleveland, J. P.; Jarvis, S. P. // Review of Scientific Instruments;Jan2006, Vol. 77 Issue 1, p013701 

    Atomic force microscopes typically require knowledge of the cantilever spring constant and optical lever sensitivity in order to accurately determine the force from the cantilever deflection. In this study, we investigate a technique to calibrate the optical lever sensitivity of rectangular...

  • Thermal calibration of photodiode sensitivity for atomic force microscopy. Attard, Phil; Pettersson, Torbjörn; Rutland, Mark W. // Review of Scientific Instruments;Nov2006, Vol. 77 Issue 11, p116110 

    The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations of the cantilever angle. The method accounts for the ratio of the thermal fluctuations measured in the fundamental vibration mode to the total, and also for the tilt...

  • Nondestructive and noncontact method for determining the spring constant of rectangular cantilevers. Golovko, Dmytro S.; Haschke, Thomas; Wiechert, Wolfgang; Bonaccurso, Elmar // Review of Scientific Instruments;Apr2007, Vol. 78 Issue 4, p043102 

    We present here an experimental setup and suggest an extension to the long existing added-mass method for the calibration of the spring constant of atomic force microscope cantilevers. Instead of measuring the resonance frequency shift that results from attaching particles of known masses to the...

  • Direct force balance method for atomic force microscopy lateral force calibration. Asay, David B.; Kim, Seong H. // Review of Scientific Instruments;Apr2006, Vol. 77 Issue 4, p043903 

    A new and simple calibration method for atomic force microscopy (AFM) is developed. This nonscanning method is based on direct force balances on surfaces with known slopes. The lateral force calibration is performed during force-distance measurements for normal force calibration. This method...

  • Corrected direct force balance method for atomic force microscopy lateral force calibration. Asay, David B.; Hsiao, Erik; Kim, Seong H. // Review of Scientific Instruments;Jun2009, Vol. 80 Issue 6, p066101 

    This paper reports corrections and improvements of the previously reported direct force balance method (DFBM) developed for lateral calibration of atomic force microscopy. The DFBM method employs the lateral force signal obtained during a force-distance measurement on a sloped surface and...

  • Cantilever spring constant calibration using laser Doppler vibrometry. Ohler, Benjamin // Review of Scientific Instruments;Jun2007, Vol. 78 Issue 6, p063701 

    Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the accuracy of these methods can be limited by both the physical models themselves as well as...

  • Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: A kinetostatic method. Tseytlin, Yakov M. // Review of Scientific Instruments;Feb2008, Vol. 79 Issue 2, p025102 

    Our previous study of the particle mass sensor has shown a large ratio (up to thousands) between the spring constants of a rectangular cantilever in higher mode vibration and at the static bending or natural mode vibration. This has been proven by us through the derived nodal point position...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics