TITLE

Relaxor behavior in sol–gel-derived BaZr[sub (0.40)]Ti[sub (0.60)]O[sub 3] thin films

AUTHOR(S)
Dixit, A.; Majumder, S. B.; Katiyar, R. S.; Bhalla, A. S.
PUB. DATE
April 2003
SOURCE
Applied Physics Letters;4/21/2003, Vol. 82 Issue 16, p2679
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In the present work, we have reported the phase transition behavior of sol-gel-derived (BaZr[SUB0.4]Ti[SUB0.6]O[SUB3] (BZT40) thin films. The dielectric properties of these films were measured as a function of temperature in the frequency range of 1 kHz to 1 MHz. A broad dielectric anomaly coupled with the shift of dielectric maxima toward a higher temperature with increasing frequency indicates the relaxor-type behavior in the films. The index of relaxation (g) and the broadening parameter (D) were estimated from a linear fit of the modified Curie-Weiss law. The value of γ &asym; 1.79 and Δ &asym; 76 K indicates the strong relaxor nature of these films. A remarkably good fit to the Vogel-Fulcher relation further supports such a relaxor nature. The films showed good polarization hysteresis at a low temperature, though that slims down yet persists even above the dielectric maximum temperature (T[SUBm]), which is about 170 K.
ACCESSION #
9518373

 

Related Articles

  • Enhancement of dielectric constant and associated coupling of polarization behavior in thin film relaxor superlattices. Corbett, M. H.; Bowman, R. M.; Gregg, J. M.; Foord, D. T. // Applied Physics Letters;8/6/2001, Vol. 79 Issue 6 

    Thin film capacitor structures in which the dielectric is composed of superlattices of the relaxors [0.2Pb(Zn[sub 1/3]Nb[sub 2/3])O[sub 3]–0.8BaTiO[sub 3]] and Pb(Mg[sub 1/3]Nb[sub 2/3])O[sub 3] have been fabricated by pulsed laser deposition. Superlattice wavelength (Λ) was varied...

  • Anomaly of dielectric properties in tens-nanometer-thick lead lanthanum zirconate titanate films on a platinum substrate. Kanata, T.; Nakagawa, T.; Okuyama, M.; Hamakawa, Y.; Ibuki, S. // Journal of Applied Physics;10/15/1989, Vol. 66 Issue 8, p3924 

    Presents a study that evaluated the dielectric properties in lead lanthanum zirconate titanate thin films grown on a platinum substrate. Methodology; Examination of the crystallographic characteristics of the thin films; Analysis of the dielectric constants of the thin films; Influence of...

  • The growth behavior of Pb0.95La0.05(Zr0.7Ti0.3)0.9875O3 films on silicon substrates synthesized by pulsed laser deposition. Yeh, M. H.; Liu, K. S.; Ling, Y. C.; Wang, J. P.; Lin, I. N. // Journal of Applied Physics;5/15/1995, Vol. 77 Issue 10, p5335 

    Presents a study that examined the effect of processing parameters on the characteristics of deposited lead-base ferroelectric thin films. Analysis of the growth behavior of the thin films; Evaluation of the capacitance-voltage characteristics of the samples; Examination of the dielectric...

  • The dielectric dispersion of insulating films with long-range movements of charge carriers. Iwamoto, Mitsumasa // Journal of Applied Physics;5/15/1995, Vol. 77 Issue 10, p5314 

    Presents a study that analyzed the dielectric dispersion of insulating thin films with long-range movements of charge carriers. Methodology; Correlation between space-charge field and dielectric dispersion; Determination of the dielectric loss peak frequency.

  • Soft-mode hardening in SrTiO3 thin films. Sirenko, A.A.; Bernhard, C. // Nature;3/23/2000, Vol. 404 Issue 6776, p373 

    Discusses far-infrared ellipsometry and low-frequency dielectric measurements in strontium titanium oxide thin films. Lyddane-Sachs-Teller relation between the optical-phonon eigenfrequencies and the dielectric constant; Relationship of the dielectric constant to lattice dynamical properties;...

  • Millimeter-wave dielectric properties of epitaxial vanadium dioxide thin films. Hood, P. J.; DeNatale, J. F. // Journal of Applied Physics;7/1/1991, Vol. 70 Issue 1, p376 

    Studies the dielectric properties of grain-oriented thin-film vanadium dioxide on single-crystal sapphire. Details on the experiment; Results of the study; Conclusion.

  • Microwave measurement of the dielectric constant of Sr[sub 0.5]Ba[sub 0.5]TiO[sub 3].... Carroll, K.R.; Pond, J.M.; Chrisey, D.B.; Horwitz, J.S.; Leuchtner, R.E.; Grabowski, K.S. // Applied Physics Letters;4/12/1993, Vol. 62 Issue 15, p1845 

    Presents measurements of the relative dielectric constant of a Sr[sub 0.5]Ba[sub 0.5]TiO[sub 3] thin film. Fabrication of transmission line from a trilayer structure; Presence of smaller bias voltages; Determination of the electric field modulation value.

  • Mg-doped Ba[sub 0.6]Sr[sub 0.4]TiO[sub 3] thin films for tunable microwave applications. Joshi, P. C.; Joshi, P.C.; Cole, M. W.; Cole, M.W. // Applied Physics Letters;7/10/2000, Vol. 77 Issue 2 

    We report on the microstructural and electrical properties of Mg-doped Ba[sub 0.6]Sr[sub 0.4]TiO[sub 3] thin films prepared by the metalorganic solution deposition technique using carboxylate-alkoxide precursors at a postdeposition annealing temperature of 750 °C. The structure and morphology...

  • Measurement of mechanical properties for dense and porous polymer films having a low dielectric constant. Xu, Yuhuan; Tsai, Yipin; Zheng, D. W.; Tu, K. N.; Wo Ong, Chung; Choy, Chung Loong; Zhao, Bin; Liu, Q.-Z.; Brongo, Maureen // Journal of Applied Physics;11/15/2000, Vol. 88 Issue 10 

    We measured the mechanical properties of dense and porous polymeric films, the modified polyarylethers, which have a low dielectric constant varying from 2.7 to 1.8, by combining three different methods; membrane bulge test, nanoindentation, and single-substrate bending beam method. The elastic...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics