Relaxor behavior in sol–gel-derived BaZr[sub (0.40)]Ti[sub (0.60)]O[sub 3] thin films

Dixit, A.; Majumder, S. B.; Katiyar, R. S.; Bhalla, A. S.
April 2003
Applied Physics Letters;4/21/2003, Vol. 82 Issue 16, p2679
Academic Journal
In the present work, we have reported the phase transition behavior of sol-gel-derived (BaZr[SUB0.4]Ti[SUB0.6]O[SUB3] (BZT40) thin films. The dielectric properties of these films were measured as a function of temperature in the frequency range of 1 kHz to 1 MHz. A broad dielectric anomaly coupled with the shift of dielectric maxima toward a higher temperature with increasing frequency indicates the relaxor-type behavior in the films. The index of relaxation (g) and the broadening parameter (D) were estimated from a linear fit of the modified Curie-Weiss law. The value of γ &asym; 1.79 and Δ &asym; 76 K indicates the strong relaxor nature of these films. A remarkably good fit to the Vogel-Fulcher relation further supports such a relaxor nature. The films showed good polarization hysteresis at a low temperature, though that slims down yet persists even above the dielectric maximum temperature (T[SUBm]), which is about 170 K.


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