Probing the polymer-electrode interface using neutron reflection

Mitchell, William J.; Burn, Paul L.; Thomas, Robert K.; Fragneto, Giovanna
April 2003
Applied Physics Letters;4/21/2003, Vol. 82 Issue 16, p2724
Academic Journal
We demonstrate that neutron reflection (NR) can be used to characterize polymer films deposited on indium tin oxide (ITO). When the chloro precursor to poly[2-(2'-ethylhexyloxy)-5-methoxy-1,4-phenylenevinylene] (MEHPPV) was spin-coated onto ITO NR revealed that between the ITO and the uniform polymer layer was a 20 Å thick low contact zone. We found that the conversion of the chloro precursor to MEHPPV at 180°C under vacuum gave a uniform film of MEHPPV with the layer of low contact between the polymer and ITO remaining. Finally, the NR profile suggests that the blueshift in the MEHPPV absorption spectrum on ITO when compared to quartz is due to polymer morphology and not incomplete conversion.


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