TITLE

Two new imaging techniques promise to improve IC defect identification

AUTHOR(S)
Ajluni, Cheryl
PUB. DATE
July 1995
SOURCE
Electronic Design;7/10/95, Vol. 43 Issue 14, p37
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Presents two imaging techniques that promise to propel the art of integrated circuit (IC)-defect identification. Proponents of the imaging techniques; Research venue; Features of the Light-Induced Voltage Alteration (LIVA) and the Low-Energy Charge-Induced Voltage Alteration (LECIVA); Capabilities of the two techniques; Benefits derived; Uses of these techniques; Processes involved.
ACCESSION #
9508223750

 

Share

Read the Article

Courtesy of MICHIGAN ELIBRARY

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics