TITLE

Characterization of 4H-SiC Bipolar Junction Transistor at High Temperatures

AUTHOR(S)
Nuo Zhang; Yi Rao; Nuo Xu; Maralani, Ayden; Pisano, Albert P.
PUB. DATE
March 2014
SOURCE
Materials Science Forum;2014, Vol. 778-780, p1013
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
In this work, a 4H-Silicon Carbide (SiC) Bipolar Junction Transistor (BJT) capable of operating at high temperatures up to 673 K is demonstrated. Comprehensive characterization including current gain, early voltage, and intrinsic voltage gain was performed. At elevated temperatures, although the current gain of the device is reduced, the intrinsic voltage gain increases to 5900 at 673 K, suggesting 4H-SiC BJT has the potential to be used as a voltage amplifier at extremely high temperatures.
ACCESSION #
94903235

 

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