Accelerated pre-oxidation method for healing progressive electrical short in organic light-emitting devices

Kim, Youngkyoo; Choi, Dongkwon; Lim, Hyuntaek; Ha, Chang-Sik
April 2003
Applied Physics Letters;4/7/2003, Vol. 82 Issue 14, p2200
Academic Journal
The accelerated pre-oxidation method (APOM) was applied to heal progressive electrical short (PES) in organic light-emitting devices. The APOM applied to the devices showed approximately 100 times lower leakage current and 25% improvement in device efficiency compared to a normal device without the APOM applied. The mean projected lifetime of the APOM devices was more than 2400 h at initial luminance of 100 cd/m² and 90 °C, whereas the normal device turned off after 15 h of operation at the same temperature due to the PES phenomenon. The best stability at elevated temperature was achieved by using the APOM for the cathode layer.


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