TITLE

Mercury cadmium telluride/tellurium intergrowths in HgCdTe epilayers grown by molecular-beam epitaxy

AUTHOR(S)
Aoki, T.; Smith, David J.; Chang, Y.; Zhao, J.; Badano, G.; Grein, C.; Sivananthan, S.
PUB. DATE
April 2003
SOURCE
Applied Physics Letters;4/7/2003, Vol. 82 Issue 14, p2275
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Surface crater defects in HgCdTe epilayers grown by molecular-beam epitaxy have been investigated using cross-sectional scanning and transmission electron microscopy, as well as atomic force microscopy. These defects originated primarily within the HgCdTe films, and were shown to be associated with the local development of polycrystalline morphology. High-resolution observations established the occurrence of finely spaced HgCdTe/Te intergrowths with either semicoherent or incoherent grain boundaries, as well as small HgCdTe inclusions embedded within Te grains.
ACCESSION #
9428278

 

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