Geometrical field effects in voltage pulse fabrication of nanostructures using scanning

Campbell, P.A.; Farnan, G.A.; Walmsley, D.G.
August 1998
Journal of Applied Physics;8/1/1998, Vol. 84 Issue 3, p1378
Academic Journal
Presents information on a study conducted which investigated the voltage pulsed modification of nanostructures, to assess the physical processes involved by using a scanning tunneling microscope. How nanoscale features can be created using a scanning tunneling microscope; Examination of the process of hole creating during voltage pulsing; Effects of subsequent pulsing; Methodology used in the study; Results of the study.


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