TITLE

3D Integrated Circuits Show Extreme RF Potential

AUTHOR(S)
DELISLE, JEAN-JACQUES
PUB. DATE
December 2013
SOURCE
Microwaves & RF;Dec2013, Vol. 52 Issue 12, p40
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
The article discusses various developments related to the Radio Frequency (RF), integrated-circuit (IC) and semiconductor industries. It presents an overview of three-dimensional (3D) ICs, which have potential power, cost, space, processing time and interconnect reductions for high-performance applications. It is noted that 25 million Euros have been spent by AMS AG in an analog 3D IC process expansion.
ACCESSION #
93425032

 

Related Articles

  • Zarlink's Technology Is Selected For Swallowable Camera Pill.  // Microwaves & RF;Aug2004, Vol. 43 Issue 8, p22 

    Reports on the selection of ultra low-power transmitter chip from Zarlink Semiconductor by Given Imaging Ltd. for its M2A capsule endoscope. Features of the M2A capsule; Remarks from Kevin Rubey, chief operating officer of Given Imaging, about the radio frequency transmitter from Zarlink.

  • Automotive ISO26262 safety-compliant LIN transceiver.  // EDN Europe;Sep2013, Vol. 9, p49 

    The article offers brief information on the AS8530 miniature power/transceiver integrated circuit (IC) from AMS AG.

  • RF component suppliers aim to ease the design path. Nass, Richard // Portable Design;May2003, Vol. 9 Issue 5, p25 

    Focuses on the improvement of radio frequency subsystem design. Networks built on the 802.11b technology; Power-consumption argument; Mercury 5G dual-mode chip.

  • Rf ICs cut the ties that bind. Schweber // EDN;10/28/99, Vol. 44 Issue 22, p98 

    Focuses on the functions of radio frequency integrated circuits (RF IC), a wireless link application for monitors. Factors driving wireless links; Range needed to reach a source; Diversity of architectures for applications; Assessment of the suitability of infrared link. INSETS: It's a Rodney...

  • Analyze test confidence to enhance throughput. Jones // Test & Measurement World;Sep99, Vol. 19 Issue 11, p27 

    Focuses on the testing of radio frequency integrated circuits. Improvement of test yield; Probability of making a good connection; Determination of the value of a retest; Test-confidence measurement.

  • Managing RFIC Test Challenges for WLAN Services. Lukez, John // Wireless Design & Development;Jan2005, Vol. 13 Issue 1, p40 

    Presents information on the management of radio frequency integrated circuit (RFIC) test challenges for wireless local area network services. Delivery by semiconductor companies of bandwidth consumer products; Use of complex modulation protocols; Test requirements being imposed by RFIC.

  • Perusing Package Options For ICs. Browne, Jack // Microwaves & RF;Feb2011, Vol. 50 Issue 2, p51 

    The article focuses on the integration of semiconductor processing that allow digital and analog functions to be carried within a single compact housing. It says that not all the goals for the said advancements are easy to satisfy at the same time, however the packaging side of radio frequency...

  • Multi-band, multi-standard receiver chip readies for launch. Prophet, Graham // EDN Europe;Oct2008, Vol. 55 Issue 10, p14 

    The article focuses on the evaluation of the production silicon of E4000 multi-band complementary metal oxide semiconductor. (CMOS) tuner chip by Elonics, a fabless semi-conductro company. The E4000 provides a single, all-CMOS, low-power Radio frequency (RF) front end that covers all standards...

  • A Message From The President…. Lillard, R. Dale // Wireless Design & Development;Nov2008, Vol. 16 Issue 11, p40 

    The article features the military and commercial semiconductors manufacturer Lansdale Semiconductor Inc. Founded in 1964, Lansdale is a leading provider of semiconductor aftermarket radio frequency and wireless integrated circuits (IC). It is also a certified Qualified Manufacturer of electronic...

Share

Read the Article

Courtesy of THE LIBRARY OF VIRGINIA

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics