Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limit

Sokolowski-Tinten, Klaus; Blome, Christian; Blums, Juris; Cavalleri, Andrea; Dietrich, Clemens; Tarasevitch, Alexander; Uschmann, Ingo; Forster, Eckhard; Kammler, Martin; Horn-von-Hoegen, Michael; von der Linde, Dietrich
March 2003
Nature;3/20/2003, Vol. 422 Issue 6929, p287
Academic Journal
The study of phase-transition dynamics in solids beyond a time-averaged kinetic description requires direct measurement of the changes in the atomic configuration along the physical pathways leading to the new phase. The timescale of interest is in the range 10-14 to 10-12?s. Until recently, only optical techniques were capable of providing adequate time resolution, albeit with indirect sensitivity to structural arrangement. Ultrafast laser-induced changes of long-range order have recently been directly established for some materials using time-resolved X-ray diffraction. However, the measurement of the atomic displacements within the unit cell, as well as their relationship with the stability limit of a structural phase, has to date remained obscure. Here we report time-resolved X-ray diffraction measurements of the coherent atomic displacement of the lattice atoms in photoexcited bismuth close to a phase transition. Excitation of large-amplitude coherent optical phonons gives rise to a periodic modulation of the X-ray diffraction efficiency. Stronger excitation corresponding to atomic displacements exceeding 10 per cent of the nearest-neighbour distance-near the Lindemann limit-leads to a subsequent loss of long-range order, which is most probably due to melting of the material.


Related Articles

  • Lattice Dynamics in LaTa2-2xNb2xVO9-δ (x=0–0.1) Solid Solutions. Zuev, M. G.; Perelyaeva, L. A.; Arkhipova, E. V.; Kiiko, V. S. // Journal of Structural Chemistry;Mar/Apr2003, Vol. 44 Issue 2, p206 

    The oxygen nonstoichiometry δ(x) of LaTa2-2xNb2xVO9-δ (x = 0–0.1) solid solutions was studied using X‐ray phase analysis, vibrational spectroscopy, and radiospectroscopy. A correlation was found between δ(x) and the unit cell volume V(x) of the solid solutions. It was shown...

  • Thermal expansion of GaAs:Te and AlGaAs:Te at low temperatures. Leszczynski, M.; Pluzhnikov, V.B.; Czopnik, A.; Bak-Misiuk, J.; Slupinski, T. // Journal of Applied Physics;11/1/1997, Vol. 82 Issue 9, p4678 

    Studies the influence of free electrons on the lattice parameters, thermal expansion, and negative thermal expansion of GaAs:Te and AlGaAs:Te. Use of dylatometry and high-resolution x-ray diffraction; In situ changing of the free-electron concentration by illumination; Emptying of the...

  • “Isomorphous” phases in nanodispersed powders of rare-earth oxides. Shmyt'ko, I. M.; Kudrenko, E. A.; Strukova, G. K.; Klassen, N. V. // Physics of the Solid State;Jun2008, Vol. 50 Issue 6, p1157 

    Using x-ray diffraction, a structural state consisting of two “isomorphous” phases was revealed in nanocrystalline powders of simple oxides Re 2O3 ( Re = Eu, Gd, La, Lu) and Y3Ga5O12 prepared by solvent thermolysis from simple-oxide solutions followed by annealing of obtained...

  • Structure and lattice dynamics of solid solutions (1 − x)BiFeO- xANbO ( A = K, Na). Teslenko, P.; Razumnaya, A.; Ponomarenko, V.; Rudskaya, A.; Nazarenko, A.; Anokhin, A.; Avramenko, M.; Levshov, D.; Kupriyanov, M.; Yuzyuk, Yu. // Physics of the Solid State;Sep2014, Vol. 56 Issue 9, p1866 

    The structures and the dynamic characteristics of the lattices of two compositions of solid solutions of multiferroic BiFeO with ferroelectric KNbO and antiferroelctric NaNbO, namely, (1 − x)BiFeO- xKNbO and (1 − x)BiFeO- xNaNbO, have been studied using X-ray powder diffraction and...

  • IN-SITU PROBING OF LATTICE RESPONSE IN SHOCK COMPRESSED MATERIALS USING X-RAY DIFFRACTION. Hawreliak, James; Butterfield, Martin; Davies, Huw; El-Dasher, Bassem; Higginbotham, Andrew; Kalantar, Daniel; Kimminau, Giles; McNaney, James; Milathianaki, Despina; Murphy, William; Nagler, Bob; Park, Nigel; Remington, Bruce; Thorton, Lee; Whitcher, Thomas; Wark, Justin; Lorenzana, Hector // AIP Conference Proceedings;12/12/2007, Vol. 955 Issue 1, p1327 

    Lattice level measurements of material response under extreme conditions are required to build a phenomenological understanding of the shock response of solids. We have successfully used laser produced plasma x-ray sources coincident with laser driven shock waves to make in-situ measurements of...

  • Nonlinearity and dynamic phase transition of charge-density-wave lattice. Du, Chao-hung; Lo, Chung-Yu; Lin, Hsiu-Hau; Chang, Shih-Lin // Journal of Applied Physics;5/15/2007, Vol. 101 Issue 10, p104915 

    We report the investigation of the dynamic behavior of charge-density waves (CDWs) in a quasi-one-dimensional material K0.3MoO3 using x-ray scattering and multiple x-ray diffraction. Under the application of voltages, we demonstrate that the occurrence of nonlinear conductivity caused by CDW is...

  • Imaging-plate plane-wave x-ray topography of local lattice distribution due to growth striations.... Maekawa, I.; Kudo, Y.; Kojima, S.; Kawado, S.; Ishikawa, T. // Applied Physics Letters;6/7/1993, Vol. 62 Issue 23, p2980 

    Examines the effectiveness of an imaging-plate plane-wave x-ray topography (PPWT) method in the quantitative analysis of local lattice distortion in silicon crystals. Comparison with the conventional photographic-plate PPWT; Factors attributing the lattice distribution of silicon crystals;...

  • X-ray scattering study of lattice relaxation in ErAs epitaxial layers on GaAs. Miceli, P.F.; Palmstrom, C.J.; Moyers, K.W. // Applied Physics Letters;4/15/1991, Vol. 58 Issue 15, p1602 

    Evaluates the results of a high-resolution x-ray scattering study of the lattice relaxation in [001]ErAs epitaxial layers grown on [001]GaAs. ErAs film thickness dependence and lattice parameters; tetragonal distortion of the unit cell; Interference oscillations from the Bragg reflectivity.

  • Effects of Structure Instability of a V[sub 3]Si Single Crystal from X-ray Scattering Data. Stupina, N. N.; Katsnelson, A. A. // Crystallography Reports;Jul2000, Vol. 45 Issue 4, p650 

    Diffuse X-ray scattering from a V[sub 3]Si single crystal was studied at room temperature. It was demonstrated that the structure possesses instability regions associated with the formation of a new phase. The characteristic features of the q dependence of diffuse scattering are indicative of...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics