Local impedance imaging and spectroscopy of polycrystalline ZnO using contact atomic force microscopy

Shao, Rui; Kalinin, Sergei V.; Bonnell, Dawn A.
March 2003
Applied Physics Letters;3/24/2003, Vol. 82 Issue 12, p1869
Academic Journal
A current detection scanning probe technique is developed that quantifies frequency-dependent local transport properties. The approach, referred to as nanoimpedance microscopy/spectroscopy (NIM), is based on impedance spectroscopy with a conductive atomic force microscopy (AFM) tip. NIM is applied to study the quality of a tip/surface contact and transport behavior of individual grains and grain boundaries in polycrystalline ZnO. Impedance spectra were measured in the frequency range 40 Hz to 110 MHz, and the grain boundary properties are studied by nonlinear fitting of experimental data to an equivalent circuit. Two-terminal measurements are performed in the vicinity of a single ZnO grain boundary and the Cole-Cole plot indicates two major relaxation processes attributed to grain boundary relaxation and tip/surface contact.


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