Point-contact current-imaging atomic force microscopy: Measurement of contact resistance between single-walled carbon nanotubes in a bundle

Otsuka, Yoichi; Naitoh, Yasuhisa; Matsumoto, Takuya; Kawai, Tomoji
March 2003
Applied Physics Letters;3/24/2003, Vol. 82 Issue 12, p1944
Academic Journal
Conductance of bundled single-walled carbon nanotubes (b-SWCNTs) are measured by point-contact current-imaging atomic force microscopy (PCI-AFM). Simultaneous mapping of the topographic information and current through SWCNTs enable us to investigate the relationship between structure and conductance. Variation in resistance of a b-SWCNT indicates that the resistance between SWCNTs was higher than 10[sup 7] Ω with strong voltage dependence. Because PCI-AFM measurement can obtain vertical conductance information, this approach appears to be a powerful technique for characterization of nanoscale electronic devices.


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