TITLE

X Marks the DATE

AUTHOR(S)
Chappell, Jeff
PUB. DATE
March 2003
SOURCE
Electronic News;3/3/2003, Vol. 49 Issue 9, pN.PAG
SOURCE TYPE
Trade Publication
DOC. TYPE
Article
ABSTRACT
Reports on the plan of STMicroelectronics to unveil the results of its fabrication of 0.13-micron X architecture test semiconductors at the Design Automation and Test in Europe conference. Goal of forming the X Initiative; Details on the X architecture.
ACCESSION #
9248310

 

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