X Marks the DATE

Chappell, Jeff
March 2003
Electronic News;3/3/2003, Vol. 49 Issue 9, pN.PAG
Trade Publication
Reports on the plan of STMicroelectronics to unveil the results of its fabrication of 0.13-micron X architecture test semiconductors at the Design Automation and Test in Europe conference. Goal of forming the X Initiative; Details on the X architecture.


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