TITLE

Structural evolution of crystalline polymer latex films: Propagating and confined acoustic modes

AUTHOR(S)
Pierno, Matteo; Casari, Carlo S.; Piazza, Roberto; Bottani, Carlo E.
PUB. DATE
March 2003
SOURCE
Applied Physics Letters;3/10/2003, Vol. 82 Issue 10, p1532
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Structural evolution of polytetrafluoroethylene latex polymer films has been studied by Brillouin light scattering and atomic force microscopy (AFM). Using a tunable sintering process, we have controlled the degree of particle connectivity yielding a crossover in the behavior of acoustic excitations ranging from confined modes to propagating phonons. This transition has been correlated also to the surface morphology by AFM. Fully sintered films are characterized by extended "fibrillar" crystalline regions embedded in a disordered matrix, which still retain features of the original particulate structure.
ACCESSION #
9214437

 

Related Articles

  • Gradient force: The mechanism for surface relief grating formation in azobenzene functionalized polymers. Kumar, Jayant; Li, Lian; Jiang, Xin Li; Kim, Dong-Yu; Lee, Taek Seung; Tripathy, Sukant // Applied Physics Letters;4/27/1998, Vol. 72 Issue 17 

    A model for the formation of holographic surface relief gratings in azobenzene functionalized polymers is presented. Forces leading to migration of polymer chains upon exposure to light in the absorption band of the azo chromophore are attributed to dipoles interacting with the gradient of the...

  • Atomic force microscopy phase imaging of conductive polymer blends with ultralow percolition... Planes, Jerome; Samson, Yves; Cheguettine, Yasmina // Applied Physics Letters;9/6/1999, Vol. 75 Issue 10, p1395 

    Describes the atomic force microscopy phase imaging of conductive polymer blends with ultralow percolation threshold. Resolution phase contrast imaging; Insight in the distribution of the conductive phase within the matrix provided by cross-section images.

  • Covalent bond force profile and cleavage in a single polymer chain. Garnier, Lionel; Gauthier-Manuel, Bernard; van der Vegte, Eric W.; Snijders, Jaap; Hadziioannou, Georges // Journal of Chemical Physics;8/8/2000, Vol. 113 Issue 6, p2497 

    We present here the measurement of the single-polymer entropic elasticity and the single covalent bond force profile, probed with two types of atomic force microscopes (AFM) on a synthetic polymer molecule: polymethacrylic acid in water. The conventional AFM allowed us to distinguish two types...

  • Conducting probe atomic force microscopy applied to organic conducting blends. Plane`s, Je´ro⁁me; Houze´, Fre´de´ric; Chre´tien, Pascal; Schneegans, Olivier // Applied Physics Letters;10/29/2001, Vol. 79 Issue 18, p2993 

    Atomic force microscopy (AFM) is used in contact mode with a conducting tip to probe the conducting network of the conductive polymer polyaniline blended in an insulating polymer matrix. The high resistance contrast and sharp boundaries between conductive and insulating phases is observed down...

  • Determination of modified-layer thickness of glow-discharge-treated polytetrafluoroethylene film. Yablokov, M.; Sokolov, I.; Malinovskaya, O.; Gil'man, A.; Kuznetsov, A. // High Energy Chemistry;Jan2013, Vol. 47 Issue 1, p32 

    The article presents a study which experimentally measured the thickness of the modified layer in a dc discharge-treated polytetrafluoroethylene (PTFE) film. A combination of X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) techniques was used to measure the thickness....

  • Direct photoetching of polymers using radiation of high energy density from a table-top extreme ultraviolet plasma source. Barkusky, Frank; Bayer, Armin; Peth, Christian; Mann, Klaus // Journal of Applied Physics;Jan2009, Vol. 105 Issue 1, p014906 

    In order to perform material interaction studies with intense extreme ultraviolet (EUV) radiation, a Schwarzschild mirror objective coated with Mo/Si multilayers was adapted to a compact laser-driven EUV plasma source utilizing a solid Au target. By 10× demagnified imaging of the plasma a...

  • Thermomechanical writing with an atomic force microscope tip. Mamin, H.J.; Rugar, D. // Applied Physics Letters;8/24/1992, Vol. 61 Issue 8, p1003 

    Presents a technique for performing nanoindention of polymer surfaces. Use of atomic force microscope tip; Dependence of the size of the pits on the size of the laser pulse and on the loading force of the tip; Possibility of making even smaller marks.

  • Orientation control of poly(vinylidenefluoride-trifluoroethylene) crystals and molecules using atomic force microscopy. Kimura, Kuniko; Kobayashi, Kei; Yamada, Hirofumi; Horiuchi, Toshihisa; Ishida, Kenji; Matsushige, Kazumi // Applied Physics Letters;6/9/2003, Vol. 82 Issue 23, p4050 

    We have developed an aligning technique for polymer crystals and molecular chains utilizing contact-mode atomic force microscopy (AFM). We have aligned lamellar crystals and molecular chains of poly(vinylidenefluoride-trifluoroethylene) thin films. By scanning the film surface using an AFM...

  • Direct observation of polymer gel surfaces by atomic force microscopy. Suzuki, A.; Yamazaki, M.; Kobiki, Y. // Journal of Chemical Physics;1/22/1996, Vol. 104 Issue 4, p1751 

    We report here, for the first time, the direct observation of the submicron structure of gel surfaces in water by using an atomic force microscope (AFM). We present also its change in response to external stimuli; we investigated, among the variables that affect the topography of the gel...

Share

Read the Article

Courtesy of VIRGINIA BEACH PUBLIC LIBRARY AND SYSTEM

Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics