Direct measurements of grain boundary sliding in yttrium-doped alumina bicrystals

Matsunaga, K.; Nishimura, H.; Muto, H.; Yamamoto, T.; Ikuhara, Y.
February 2003
Applied Physics Letters;2/24/2003, Vol. 82 Issue 8, p1179
Academic Journal
The behavior of grain boundary sliding in pure and yttrium-doped Al[SUB2]O[SUB3] was directly measured at a high temperature, using bicrystal experiments. For this purpose, we fabricated Al[SUB2]O[SUB3] bicrystals containing a random grain boundary with or without yttrium ions. High-resolution transmission electron microscopy observations and energy dispersive x-ray spectroscopy analyses showed that bicrystals were successfully joined at an atomic scale, and doped yttrium ions segregated along the grain boundaries. It was found by compressive creep tests that the grain boundary sliding rate was restrained by two orders of magnitude due to yttrium addition, as compared to that of undoped bicrystals.


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