Passivation of defects in nitrogen-doped polycrystalline Cu[sub 2]O thin films by crown-ether cyanide treatment

Okamoto, Y.; Ishizuka, S.; Kato, S.; Sakurai, T.; Fujiwara, N.; Kobayashi, H.; Akimoto, K.
February 2003
Applied Physics Letters;2/17/2003, Vol. 82 Issue 7, p1060
Academic Journal
Crown-ether cyanide treatment, which simply involves immersion in KCN solutions containing 18-crown-6 followed by rinse, is studied in relation to electrical and optical properties of nitrogen-doped, polycrystalline Cu[sub 2]O thin films, and its effect is compared with that of hydrogen treatment. By the crown-ether cyanide treatment, the luminescence intensity due to the near-band-edge emission of Cu[sub 2]O at around 680 nm is enhanced, and the hole density is increased from the order of 10[sup 16] to 10[sup 17] cm[sup -3], analogous to hydrogen treatment. The effects of the passivation by the hydrogen treatment completely disappear after annealing at 350 °C, while those of the crown-ether cyanide treatment stay unchanged after the same annealing treatment. From these results, the crown-ether cyanide treatment for polycrystalline Cu[sub 2]O thin films can be concluded to be a more suitable method of passivating defects than the hydrogen treatment.


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