Natural-superlattice-structured Bi[sub 4]Ti[sub 3]O[sub 12]–SrBi[sub 4]Ti[sub 4]O[sub 15] ferroelectric thin films

Shibuya, Akira; Noda, Minoru; Okuyama, Masanori; Fujisawa, Hironori; Shimizu, Masaru
February 2003
Applied Physics Letters;2/3/2003, Vol. 82 Issue 5, p784
Academic Journal
Natural superlattice structures of c-axis-oriented Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] epitaxial ferroelectric thin films have been grown by pulsed laser deposition on both MgO (001) and SrTiO[sub 3] (001) substrates. The epitaxial growth of natural-superlattice-structured Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] thin film was confirmed by x-ray diffraction (XRD) θ-2θ scan, pole figure plots, and reciprocal space mappings. The c-axis lattice parameter of the Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] thin film became the average of those for Bi[sub 4]Ti[sub 3]O[sub 12] and SrBi[sub 4]Ti[sub 4]O[sub 15]. The Bi[sub 4]Ti[sub 3]O[sub 12]-SrBi[sub 4]Ti[sub 4]O[sub 15] thin film on Pt substrate shows that twice remanent polarization (2P[sub r]) and coercive field (2E[sub c]) are 32 µC/cm² and 190 kV/cm, respectively.


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