Dielectric relaxation and strain behavior of 95.5% Pb(Zn[sub 1/3]Nb[sub 2/3])O[sub 3]–4.5% PbTiO[sub 3] single crystals at cryogenic temperatures

Yu, Zhi; Ang, Chen; Furman, E.; Cross, L. E.
February 2003
Applied Physics Letters;2/3/2003, Vol. 82 Issue 5, p790
Academic Journal
The dielectric behavior of 95.5% Pb(Zn⅓Nb[sub 2/3])O[sub 3]-4.5% PbTiO[sub 3] single crystals oriented along 〈001〉 direction with and without dc electric field has been studied at cryogenic temperatures. A pronounced low-temperature dielectric relaxation process was observed below 200 K; the relaxation rate follows the Arrhenius law (τ[sub 0] = ∼1.0 × 10[sup -15] s and U=0.24 eV). An additional dielectric anomaly showed up around 250 K at 10 kHz under a dc electric field. These results indicate rather complicated polarization mechanisms at cryogenic temperatures which clearly need more detailed study. The strain levels at cryogenic temperatures suggest that this material is very promising for space applications, in which the performance at cryogenic temperatures is critical.


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