TITLE

Direct evidence for grain-boundary depletion in polycrystalline CdTe from nanoscale-resolved measurements

AUTHOR(S)
Visoly-Fisher, Iris; Cohen, Sidney R.; Cahen, David
PUB. DATE
January 2003
SOURCE
Applied Physics Letters;1/27/2003, Vol. 82 Issue 4, p556
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
We use scanning probe microscopy-based methods for direct characterization of a single grain boundary and a single grain surface in solar cell-quality CdTe, deposited by closed-space vapor transport. We find that scanning capacitance microscopy can serve to study polycrystalline electronic materials, notwithstanding the strong topographical variations. In this way, we find a barrier for hole transport across grain boundaries, a conclusion supported by the much more topography-sensitive scanning kelvin probe microscopy, with some variation in barrier height between different boundaries.
ACCESSION #
8954580

 

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