Local probing of thermal properties at submicron depths with megahertz photothermal vibrations

Tomoda, M.; Shiraishi, N.; Kolosov, O. V.; Wright, O. B.
January 2003
Applied Physics Letters;1/27/2003, Vol. 82 Issue 4, p622
Academic Journal
We demonstrate the imaging of buried features in a microstructure—a tiny hole in an aluminum thin film covered by a chromium layer—with nanometer lateral resolution using a transient temperature distribution restricted to within ∼0.5 µm of the sample surface. This is achieved by mapping photothermally induced megahertz surface vibrations in an atomic force microscope. Local thermal probing with megahertz-frequency thermal waves is thus shown to be a viable method for imaging subsurface thermal features at submicron depths.


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