Unit cell orientation of tetragonal-like BiFeO3 thin films grown on highly miscut LaAlO3 substrates

Beekman, C.; Siemons, W.; Ward, T. Z.; Budai, J. D.; Tischler, J. Z.; Xu, R.; Liu, W.; Balke, N.; Nam, J. H.; Christen, H. M.
June 2013
Applied Physics Letters;6/3/2013, Vol. 102 Issue 22, p221910
Academic Journal
Synchrotron and lab-scale x-ray diffraction shows that tetragonal-like T′-BiFeO3 films on miscut LaAlO3 substrates (α < 5°) exhibit (00l)-planes tilted away from those of the substrate as predicted by the 'Nagai model' (except for miscut < 0.2°). Tilts as large as 1° are achieved even in 100 nm thick films, strikingly larger than those observed in other perovskites. We attribute this to the large c/a ratio and the high crystalline coherency of the T′-BiFeO3/LaAlO3 interface. This coherency is possible through an observed 'diagonal-on-diagonal' film/substrate alignment. Interestingly, the substrate miscut does not influence the relative population of monoclinic domains.


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