Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

Rosenman, G.; Urenski, P.; Agronin, A.; Rosenwaks, Y.; Molotskii, M.
January 2003
Applied Physics Letters;1/6/2003, Vol. 82 Issue 1, p103
Academic Journal
We have developed a high voltage atomic force microscope that allowed us to tailor submicrometer ferroelectric domains in bulk ferroelectrics. One- and two-dimensional domain configurations have been fabricated in LiNbO[sub 3], RbTiOPO[sub 4], and RbTiOAsO[sub 4] ferroelectric crystals. It is found that the application of superhigh electric fields (reaching 5 × 10[sup 7] V/cm) by the atomic force microscope tip leads to a unique polarization reversal mechanism, and open the way to a technology for photonic and acoustic devices.


Related Articles

  • Ferroelectric domain inversion: The role of humidity. Dahan, D.; Molotskii, M.; Rosenman, G.; Rosenwaks, Y. // Applied Physics Letters;10/9/2006, Vol. 89 Issue 15, p152902 

    The authors report on the effect of ambient humidity on domain inversion in ferroelectrics using atomic force microscopy. It is shown that the size of single domains inverted under low humidity in stoichiometric lithium tantalate single crystals is much smaller relative to ambient conditions....

  • Principle of ferroelectric domain imaging using atomic force microscope. Hong, Seungbum; Woo, Jungwon; Shin, Hyunjung; Jeon, Jong Up; Pak, Y. Eugene; Colla, Enrico L.; Setter, Nava; Kim, Eunah; No, Kwangsoo // Journal of Applied Physics;1/15/2001, Vol. 89 Issue 2, p1377 

    The contrast mechanisms of domain imaging experiments assisted by atomic force microscope (AFM) have been investigated by model experiments on nonpiezoelectric (silicon oxide) and piezoelectric [Pb(Zr,Ti)O[sub 3]] thin films. The first step was to identify the electrostatic charge effects...

  • Structural and optical properties of Bi[sub 3.25] La[sub 0.75] Ti[sub 3] O[sub 12] ferroelectric thin films prepared by chemical solution methods. Wang, G.S.; Meng, X.J.; Lai, Z.Q.; Yu, J.; Sun, J.L.; Guo, S.L.; Chu, J.H. // Applied Physics A: Materials Science & Processing;2003, Vol. 76 Issue 1, p83 

    Ferroelectric Bi[sub 3.25] La[sub 0.75] Ti[sub 3] O[sub 12] (BLT) thin films have been grown on Pt/Ti/SiO[sub 2] /Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy...

  • Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope. Tiedke, S.; Schmitz, T.; Prume, K.; Roelofs, A.; Schneller, T.; Kall, U.; Waser, R.; Ganpule, C. S.; Nagarajan, V.; Stanishevsky, A.; Ramesh, R. // Applied Physics Letters;11/26/2001, Vol. 79 Issue 22, p3678 

    Direct hysteresis measurements on single submicron structure sizes were performed on epitaxial ferroelectric Pb(Zr,Ti)O[sub 3] thin films grown on SrTiO[sub 3] with La[sub 0.5]Sr[sub 0.5]CoO[sub 3] (LSCO) electrodes. The samples were fabricated by focused-ion-beam milling resulting in pad sizes...

  • Elasticity Imaging of Ferroelectric Domain Structure in PZT by Ultrasonic Atomic Force Microscopy. Tsuji, T.; Ogiso, H.; Fukuda, K.; Yamanaka, K. // AIP Conference Proceedings;2004, Vol. 700 Issue 1, p1069 

    UAFM was applied to the observation of the domain structure in lead zirconate titanate (PZT). It imaged the change of elasticity due to grain and domain boundary (DB). For the quantitative evaluation of the contact stiffness, the lateral contact stiffness was taken into account. The stiffness of...

  • Nanoscopic measurements of the electrostriction responses in P(VDF/TrFE) ultra-thin-film copolymer using atomic force microscopy. El Hami, K.; Yamada, H.; Matsushige, K. // Applied Physics A: Materials Science & Processing;2001, Vol. 72 Issue 3, p347 

    Abstract. Atomic force microscopy (AFM) has been used as a new method to perform nanoscale measurements of the electrostriction coefficients in the lamellae structure of the ferroelectric P(VDF/TrFE) 73/27 copolymers. The result found shows that the electrostriction coefficient inside (in the...

  • Magnetic force microscopy images of magnetic garnet with thin-film magnetic tip. Wadas, A.; Moreland, John // Applied Physics Letters;2/28/1994, Vol. 64 Issue 9, p1156 

    Analyzes the magnetic force microscopy images of magnetic garnet using a thin magnetic film deposited on Si[sub 3]N[sub 5] atomic force microscopy tips. Correlation between the topography and magnetic domain structure; Reasons for the visibility of the domain walls as bright lines; Ways to...

  • Large exchange bias and its connection to interface structure in FeF[sub 2]-Fe bilayers. Nogues, J.; Lederman, D. // Applied Physics Letters;5/27/1996, Vol. 68 Issue 22, p3186 

    Examines the large exchange bias effects observed in antiferromagnetic-ferromagnetic bilayers grown on MgO. Direction of antiferromagnetic growth; Characteristics of FeF[sub 2]-Fe interface roughness using specular and diffuse x-ray diffraction and atomic force microscopy; Implications of the...

  • Domain structure and electrical properties of Gd-and Tm-doped lithium niobate single crystals. Palatnikov, M. N.; Loginov, B. A.; Sidorov, N. V.; Shcherbina, O. B.; Biryukova, I. V.; Efremov, V. V.; Smith, P. G. R.; Kalinnikov, V. T. // Inorganic Materials;Jan2007, Vol. 43 Issue 1, p68 

    We have grown lithium niobate single crystals doped with rare-earth elements (Gd and Tm) and have examined etch patterns on their surfaces by atomic force microscopy. The thermal stability of their regular domain structure has been assessed, and their anomalous electrical properties have been...


Read the Article


Sorry, but this item is not currently available from your library.

Try another library?
Sign out of this library

Other Topics