TITLE

Polarized infrared reflectance characterization of wurtzite ZnO/GaN heterostructure on 6H-SiC substrate

AUTHOR(S)
Lee, S. C.; Ng, S. S.; Ooi, P. K.; Hassan, H. Abu; Hassan, Z.; Abdullah, M. J.
PUB. DATE
May 2013
SOURCE
AIP Conference Proceedings;May2013, Vol. 1528 Issue 1, p93
SOURCE TYPE
Academic Journal
DOC. TYPE
Article
ABSTRACT
Infrared (IR) optical properties of a wurtzite ZnO/GaN heterostructure on a wurtzite 6H-SiC substrate are characterized by a polarized IR reflectance spectroscopy. The relation between the reststrahlen features and the optical phonon modes of each individual layer are investigated. It is shown that the transverse magnetic polarized IR reflectance spectrum provides the least loss of information about the optical phonon frequencies of wurtzite crystal. By means of the standard multilayer optics technique and based on an anisotropic dielectric function model, polarized IR reflectance spectra of the studied structure are simulated. Numerical fitting procedure is applied to obtain the best fit of experimental and theoretical spectra. Finally, the optical phonon frequencies and the layers thicknesses of the studied structures are determined.
ACCESSION #
87497255

 

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