Onset of long-range diffusion and exponent of 1/f[sup α] noise in metal films with electromigration damage

Kar, Swastik; Raychaudhuri, A. K.
December 2002
Applied Physics Letters;12/30/2002, Vol. 81 Issue 27, p5165
Academic Journal
Investigations of low-frequency conductance fluctuations have been done on silver films which have been made to undergo electromigration damage. The system shows a clear increase in noise magnitude after electromigration damage. The noise spectral power shows a distinct presence of 1/f[sup 3/2] component arising out of long-range diffusion. The temperature dependence of noise (150 K< T<350 K) shows a marked deviation from the Dutta-Hom type behavior with the 1/f[sup 3/2] term showing a strong dominance at higher temperatures. We propose that the increase of noise in metal films after electromigration damage arise predominantly from this spectral component.


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